TIME-RESOLVED HIGH-RESOLUTION ELECTRON-MICROSCOPY OF SURFACE-DIFFUSION OF TUNGSTEN ATOMS ON MGO(001) SURFACES

Citation
N. Tanaka et al., TIME-RESOLVED HIGH-RESOLUTION ELECTRON-MICROSCOPY OF SURFACE-DIFFUSION OF TUNGSTEN ATOMS ON MGO(001) SURFACES, Journal of Electron Microscopy, 45(1), 1996, pp. 113-118
Citations number
18
Categorie Soggetti
Microscopy
ISSN journal
00220744
Volume
45
Issue
1
Year of publication
1996
Pages
113 - 118
Database
ISI
SICI code
0022-0744(1996)45:1<113:THEOS>2.0.ZU;2-F
Abstract
A surface diffusion process of tungsten (W)-atoms on MgO (001) surface s was studied by high-resolution electron microscopy (HREM) in the tim e resolution of 1/60 s, The W-atoms were prepared on single crystallin e MgO (001) films at 300 degrees C by vacuum-deposition of WO3 or W-me tal. Analysis of recorded images revealed individual jump-process of t he W-atoms in the substrate temperature from R.T. to 400 degrees C, an d gave the barrier potential (E(d)) and the pre-exponential factor (D- o), Details of the microscopy and the data-analysis method are describ ed as advanced techniques of HREM.