INTERFEROMETRIC MEASUREMENTS OF THE PHOTOINDUCED REFRACTIVE-INDEX PROFILES IN PHOTOREFRACTIVE BI12TIO20 CRYSTAL

Authors
QUIRINO GSG CASTILLO MDI SANCHEZMONDRAGON JJ STEPANOV S VYSLOUKH V
Citation
Gsg. Quirino et al., INTERFEROMETRIC MEASUREMENTS OF THE PHOTOINDUCED REFRACTIVE-INDEX PROFILES IN PHOTOREFRACTIVE BI12TIO20 CRYSTAL, Optics communications, 123(4-6), 1996, pp. 597-602
Citations number
9
Categorie Soggetti
Optics
Journal title
Optics communications → ACNP
ISSN journal
00304018
Volume
123
Issue
4-6
Year of publication
1996
Pages
597 - 602
Database
ISI
SICI code
0030-4018(1996)123:4-6<597:IMOTPR>2.0.ZU;2-Y
Abstract
By direct interferometric measurement in Bi12TiO20 under external DC e lectric field, we demonstrate that the steady-state photorefractive le ns produced by the laser beam with the initial circular cross-section is essentially anisotropic: its focusing strength along the direction of the applied electric field is remarkably higher. Experimental data are supported by computer simulations and analytical results.