We examine the crystallographic texture exhibited by cubic boron;nitri
de (cBN) in thin films grown by ion-assisted deposition. Our analysis
indicates that the cBN is preferentially oriented such that individual
crystallites have at least one [111] direction lying in the plane of
the film but are otherwise randomly oriented about (1) the substrate n
ormal and (2) the in-plane cBN [111] axis. This preferential orientati
on is consistent with an alignment between the cBN {111} planes and th
e basal planes of the layer of highly oriented graphitic boron nitride
:that forms in the initial stages of film growth.