INVESTIGATION OF CRYSTALLINITY OF GERMANIUM THIN-FILMS VACUUM-DEPOSITED ON GAAS

Authors
MUKHERJI D SINGH RK
Citation
D. Mukherji et Rk. Singh, INVESTIGATION OF CRYSTALLINITY OF GERMANIUM THIN-FILMS VACUUM-DEPOSITED ON GAAS, Journal of materials science. Materials in electronics, 2(3), 1991, pp. 141-145
Citations number
5
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Condensed Matter","Material Science
Journal title
Journal of materials science. Materials in electronics → ACNP
ISSN journal
09574522
Volume
2
Issue
3
Year of publication
1991
Pages
141 - 145
Database
ISI
SICI code
0957-4522(1991)2:3<141:IOCOGT>2.0.ZU;2-6