An investigation was made of the distribution of the velocities of the
droplets and of the atomic component in a plasma plume formed during
laser ablation of InAs and GaAs semiconductor targets. The velocity of
atoms was at least 6 times greater than the velocity of droplets. A m
echanical velocity filter for the removal of droplets from the plasma
plume was constructed. The use of a composite target made it possible
to grow epitaxial InxGa1-xAs films of different compositions.