Ar. Phani et al., MOCVD GROWTH OF BORON-NITRIDE FILMS FROM SINGLE SOURCE III-V PRECURSOR, Journal of the Chemical Society, Chemical Communications, (8), 1993, pp. 684-685
The sp2 and sp3 phases of boron nitride (BN) have been deposited on Si
and Ni substrates by low pressure MO-CVD (metal organic chemical vapo
ur deposition) at 450-degrees-C from diethylaminoborane and the films
were characterised by Fourier transform infrared (FTIR) and X-ray diff
raction (XRD); a plausible mechanism of CVD is proposed from gas-phase
decomposition studies, and to our knowledge this is the first report
of the growth of BN by MO-CVD using a single source.