A two-wavelength surface contouring system based on electronic speckle
pattern interferometry (ESPI) with a pulsed ruby laser is reported. T
wo states of the test object were recorded at different wavelengths of
the laser. The wavelength change was controlled by altering the tempe
rature of the output etalon. The phase information of the surface cont
our can be obtained by using either the sinusoid fitting method or the
Fourier transform method. Contour intervals of about 14 mm and 7 mm a
re available.