TEMPERATURE SENSITIVITY AND THERMAL-EXPANSION COEFFICIENT OF BENZOCYCLOBUTENE THIN-FILMS STUDIED WITH ELLIPSOMETRY

Citation
S. Guo et al., TEMPERATURE SENSITIVITY AND THERMAL-EXPANSION COEFFICIENT OF BENZOCYCLOBUTENE THIN-FILMS STUDIED WITH ELLIPSOMETRY, Applied physics letters, 68(14), 1996, pp. 1910-1912
Citations number
9
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
68
Issue
14
Year of publication
1996
Pages
1910 - 1912
Database
ISI
SICI code
0003-6951(1996)68:14<1910:TSATCO>2.0.ZU;2-F
Abstract
Temperature induced changes in thickness and refractive index of thin films of benzocyclobutene (BCB) have been studied with ellipsometry in the temperature range 22-190 degrees C. The ellipsometric parameters psi and Delta, which depend on both the thickness and the optical cons tants of the BCB films, change significantly with temperature with sho rt response times. The temperature sensitivity, resolution, and dynami c range depend on film thickness and wavelength. For a film with thick ness 4.73 mu m, a sensitivity of 0.2 degrees/degrees C with a resoluti on of 0.25 degrees C is achieved within a range of 170 degrees C. Ther mal expansion coefficients (TEC) of BCB films with different thickness es evaluated from spectroscopic ellipsometric measurements are in the range 6.1-6.5X10(-5)/degrees C. Based on the findings here, a real-tim e detection system for remote optical monitoring of surface temperatur e variation can be developed. A technique for the determination of TEC of some organic films is also feasible. (C) 1994 American Institute o f Physics.