S. Guo et al., TEMPERATURE SENSITIVITY AND THERMAL-EXPANSION COEFFICIENT OF BENZOCYCLOBUTENE THIN-FILMS STUDIED WITH ELLIPSOMETRY, Applied physics letters, 68(14), 1996, pp. 1910-1912
Temperature induced changes in thickness and refractive index of thin
films of benzocyclobutene (BCB) have been studied with ellipsometry in
the temperature range 22-190 degrees C. The ellipsometric parameters
psi and Delta, which depend on both the thickness and the optical cons
tants of the BCB films, change significantly with temperature with sho
rt response times. The temperature sensitivity, resolution, and dynami
c range depend on film thickness and wavelength. For a film with thick
ness 4.73 mu m, a sensitivity of 0.2 degrees/degrees C with a resoluti
on of 0.25 degrees C is achieved within a range of 170 degrees C. Ther
mal expansion coefficients (TEC) of BCB films with different thickness
es evaluated from spectroscopic ellipsometric measurements are in the
range 6.1-6.5X10(-5)/degrees C. Based on the findings here, a real-tim
e detection system for remote optical monitoring of surface temperatur
e variation can be developed. A technique for the determination of TEC
of some organic films is also feasible. (C) 1994 American Institute o
f Physics.