IMPACT OF HIGH-PRECISION PROCESSING ON THE FUNCTIONAL ENHANCEMENT OF NEURON-MOS INTEGRATED-CIRCUITS

Citation
K. Kotani et al., IMPACT OF HIGH-PRECISION PROCESSING ON THE FUNCTIONAL ENHANCEMENT OF NEURON-MOS INTEGRATED-CIRCUITS, IEICE transactions on electronics, E79C(3), 1996, pp. 407-414
Citations number
24
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
09168524
Volume
E79C
Issue
3
Year of publication
1996
Pages
407 - 414
Database
ISI
SICI code
0916-8524(1996)E79C:3<407:IOHPOT>2.0.ZU;2-B
Abstract
In order to reduce the ever increasing cost for ULSI manufacturing due to the complexity of integrated circuits, dramatic simplification in the logic LSI architecture as well as the very flexible circuit config uration have been achieved using a high-functionality device neuron-MO SFET (nu MOS). In nu MOS logic circuits, however, computations based o n the multiple-valued logic is the key for enhancing the functionality . Therefore, much higher accuracy of processing is required. After bri ef description of the operational principle of nu MOS logic, the relat ionship between the number of multiple logic levels and the functional ity enhancement is discussed for further enhancing the functionality o f nu MOS logic circuits by increasing the number of multiple logic lev els, and the accuracy requirements for the manufacturing processes are studied. The order of a few percent accuracy is required for all prin cipal device structural parameters when it is aimed to handle 50-level multiple-valued variable in the nu MOS logic circuit.