EFFICIENT CHARACTERIZATION OF COMPLEX H-PLANE WAVE-GUIDE PI-JUNCTION AND CROSS-JUNCTIONS

An efficient full-wave approach for the accurate characterization of a H-plane waveguide pi-junction with an inductive post and a waveguide cross-junction is proposed. By employing the port reflection coefficie nt method (PRCM), the analysis and solution procedures of these comple x waveguide junctions are greatly simplified and only the calculation of field reflections caused by the simplest waveguide step-junction di scontinuities are required. The reflections are easily determined by t he mode-matching technique. Scattering parameters of these junctions a re provided and discussed in terms of the working frequency and the ge ometrical dimensions of the junctions. Calculated results are compared with those of other papers and measurements, all show good agreement.