INSITU OBSERVATIONS BY SYNCHROTRON WHITE BEAM X-RAY TOPOGRAPHY OF THEPLANAR, CELLULAR AND DENDRITIC GROWTHS OF A BINARY ALLOY

Citation
G. Grange et al., INSITU OBSERVATIONS BY SYNCHROTRON WHITE BEAM X-RAY TOPOGRAPHY OF THEPLANAR, CELLULAR AND DENDRITIC GROWTHS OF A BINARY ALLOY, Journal of physics. D, Applied physics, 26(4A), 1993, pp. 98-101
Citations number
12
Categorie Soggetti
Physics, Applied
ISSN journal
00223727
Volume
26
Issue
4A
Year of publication
1993
Pages
98 - 101
Database
ISI
SICI code
0022-3727(1993)26:4A<98:IOBSWB>2.0.ZU;2-J
Abstract
Real-time x-ray topography using white beam synchrotron radiation has been applied to a study of the planar, cellular and dendritic growths of an Al 0.73 wt.% Cu alloy. In situ observations have revealed two di fferent destabilization modes of the solidification front and have pro vided information on the microstructures obtained by cellular and dend ritic growth.