DEMONSTRATION OF NPN INAS BIPOLAR-TRANSISTORS WITH INVERTED BASE DOPING

Citation
Pe. Dodd et al., DEMONSTRATION OF NPN INAS BIPOLAR-TRANSISTORS WITH INVERTED BASE DOPING, IEEE electron device letters, 17(4), 1996, pp. 166-168
Citations number
13
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
07413106
Volume
17
Issue
4
Year of publication
1996
Pages
166 - 168
Database
ISI
SICI code
0741-3106(1996)17:4<166:DONIBW>2.0.ZU;2-S
Abstract
We demonstrate np(+)n InAs bipolar transistors that operate under room temperature and cryogenic conditions. InAs transistors on an InP subs trate were characterized as a function of temperature and exhibited go od room temperature and low temperature common-emitter characteristics . Although the base doping density exceeded the emitter doping density by a factor of 20, current gains of 30 were achieved at room temperat ure, Junction leakage currents and contact resistance were identified as problems to address.