OPTICAL 2ND-HARMONIC ELECTROREFLECTANCE SPECTROSCOPY OF A SI(001) METAL-OXIDE-SEMICONDUCTOR STRUCTURE

Citation
Ji. Dadap et al., OPTICAL 2ND-HARMONIC ELECTROREFLECTANCE SPECTROSCOPY OF A SI(001) METAL-OXIDE-SEMICONDUCTOR STRUCTURE, Physical review. B, Condensed matter, 53(12), 1996, pp. 7607-7609
Citations number
33
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
53
Issue
12
Year of publication
1996
Pages
7607 - 7609
Database
ISI
SICI code
0163-1829(1996)53:12<7607:O2ESOA>2.0.ZU;2-J
Abstract
We report the dependence of the second-harmonic spectrum of Si(001) me tal-oxide-semiconductor structures on applied bias in the vicinity of the direct two-photon E(1) transition. Bulk nonlinear electroreflectan ce contributions peak at 3.37 eV; the surface dipole contribution peak s at 3.26 eV.