M. Decrescenzi et al., STRUCTURAL SURFACE INVESTIGATION WITH LOW-ENERGY BACKSCATTERED ELECTRONS, Journal of electron spectroscopy and related phenomena, 76, 1995, pp. 29-36
We review the structural results obtained through the analysis of inel
astically backdiffused electrons from a solid surface. Thanks to the a
mount of experimental and theoretical evidences, the physical mechanis
m underlying the EELFS (Extended Energy Loss Fine Structure) features
beyond a ionization edge seems now well accepted in terms of an EXAFS-
like effect. We have found strong evidence that among the most probabl
e scattering events, namely: single inelastic diffusion, energy loss p
receded or followed by diffraction events supplied by the lattice, the
main channel of interaction with a core electron is essentially const
ituted by inelastic followed by diffraction processes. The energy loss
process occurs at a very small diffusion angle from the primary beam
direction and this explains the capability of low-energy electrons to
induce dipole transitions on the scattering matrix element of a core e
lectron. The EXFAS (EXtended Fine Auger Structure) signal, detected at
kinetic energy greater than that of the Auger transitions, increases
the usefulness of the elemental Auger spectroscopy as a local structur
al tool. Some efforts should be devoted in future to elucidating bette
r the physical process. The combination of the EELFS and EXFAS techniq
ues may help to give a wider description of a number of surface and in
terface effects.