ELEMENT-SPECIFIC, SURFACE AND SUBSURFACE STRUCTURAL-ANALYSIS BY SCATTERING-INTERFERENCE OF PRIMARY ELECTRONS

We investigated the effects of scattering-interference of primary elec trons on the secondary electron emission intensity fron ordered surfac es and interfaces. Because of the focusing-defocusing of the primary w ave along atomic chains, maxima in the electron yield occur when the e xciting beam is aligned with low index axes. Therefore the electron in tensity distributions as a function of the angle of incidence of the p rimary beam can be interpreted as projected images of real space, loca l atomic arrangement. The process can be modelled in a single scatteri ng cluster (SSC) approximation. Potential of primary-beam diffraction modulated electron emission (PDMEE) technique for surface and subsurfa ce structural characterization is shown, for Co epitaxy on Fe(001).