HIGH-RESOLUTION WAVELENGTH DISPERSIVE-X-RAY SPECTROSCOPY FOR ECR PLASMA DIAGNOSTICS

Authors
LEHNERT U ZIPPE C ZSCHORNACK G
Citation
U. Lehnert et al., HIGH-RESOLUTION WAVELENGTH DISPERSIVE-X-RAY SPECTROSCOPY FOR ECR PLASMA DIAGNOSTICS, Hyperfine interactions, 99(1-3), 1996, pp. 235-241
Citations number
10
Categorie Soggetti
Physics, Atomic, Molecular & Chemical","Physics, Nuclear","Physics, Condensed Matter
Journal title
Hyperfine interactions → ACNP
ISSN journal
03043843
Volume
99
Issue
1-3
Year of publication
1996
Pages
235 - 241
Database
ISI
SICI code
0304-3843(1996)99:1-3<235:HWDSFE>2.0.ZU;2-7
Abstract
The high resolution of a Bragg crystal diffraction spectrometer was us ed to investigate the ion charge distribution of krypton ions inside t he plasma of an 14.5 GHz ECR ion source. Analyzing the measured spectr a, we got information about the abundances and the relative densities of krypton ions of different charge states.