CRYSTAL-STRUCTURE, ELECTRONIC BAND-STRUCTURE, ELECTRICAL-RESISTIVITY AND SCANNING PROBE MICROSCOPY STUDIES OF LAYERED COMPOUND MOOCL2

The structure of MoOCl2 was determined by single crystal X-ray diffrac tion, and the electronic structure of MoOCl2 was calculated by the ext ended Huckel tight binding method. The electrical resistivity and magn etoresistivity measurements of MoOCl2 were performed, and the surfaces of MoOCl2 samples were characterized by scanning tunneling microscopy (STM) and atomic force microscopy (AFM). MoOCl2 has stacking faults i n crystal structure and is a metal. The STM and AFM images of MoOCl2 d iffer substantially in brightness pattern.