OSCILLATIONS IN REFLECTIVITY OF SAMPLES WITH X-RAY WAVE-GUIDE LAYERS

The glancing-angle reflectivity profiles in samples containing an X-ra y waveguide layer are studied. Oscillations observed at angles within the region of resonance and above, are interpreted by angle dependent interference of the monochromatic X-ray beam in thin layer. The discus sion is extended to tile structures composed of more than one layer. E xperimental reflectivity spectra recorded with Cu K-alpha radiation ar e compared with the theoretical calculations. It leads to the model of oscillations in reflectivity consistent both for the resonant and non -resonant regions, and clarifies interpretation of oscillations in the region above the resonances. A brief discussion of potential applicat ions of the reflectivity spectra to the studies of structure of thin l ayers is done.