OPTICAL CHARACTERIZATION OF MBE-GROWN CD1-XMNXTE LAYERS BY RAMAN-SPECTROSCOPY

Authors
SZUSZKIEWICZ W DYNOWSKA E JANIK E KARCZEWSKI G WOJTOWICZ T KOSSUT J
Citation
W. Szuszkiewicz et al., OPTICAL CHARACTERIZATION OF MBE-GROWN CD1-XMNXTE LAYERS BY RAMAN-SPECTROSCOPY, Acta Physica Polonica. A, 89(3), 1996, pp. 335-340
Citations number
19
Categorie Soggetti
Physics
Journal title
Acta Physica Polonica. A → ACNP
ISSN journal
05874246
Volume
89
Issue
3
Year of publication
1996
Pages
335 - 340
Database
ISI
SICI code
0587-4246(1996)89:3<335:OCOMCL>2.0.ZU;2-Q
Abstract
In this paper we discuss a possibility of an optical characterization of thin semiconductor epilayers by Raman scattering measurements. As a n example zinc blende Cd1-xMnxTe epilayers (0.66 less than or equal to x less than or equal to 1.0) have been grown by molecular beam epitax y method and investigated by Raman scattering and X-ray diffraction. I nformation resulting from both methods is compared and discussed.