V. Tale et al., THERMOACTIVATED SPECTROSCOPY OF HETEROVALENT IMPURITY TRAPS IN CDWO4, Radiation effects and defects in solids, 134(1-4), 1995, pp. 477-480
Recombination luminescence emission spectra, TSL and trap spectra esti
mated by fractional glow technique (FGT), in nominally pure and Li-, B
i- and He-doped CdWO4 crystals are reported. According to the investig
ations by FGT heterovalent impurities Li, Bi and Ho causes localized e
lectronic states which act as traps for charge carriers. It is shown t
hat TSL results in emission of known blue-green luminescence band by e
mptying of the Li+-related traps in CdWO4-Li and yellow luminescence b
and by emptying of the Bi3+-related traps in CdWO4-Bi. It is proposed
that blue-green and yellow luminescence occur by recombination corresp
ondingly of free holes and free electrons at different intrinsic tungs
tate group related luminescence centers.