SIMULATION AND OBSERVATION OF THE STEP BUNCHING PROCESS GROWN ON GAAS(001) VICINAL SURFACE BY METALORGANIC VAPOR-PHASE EPITAXY

Citation
J. Ishizaki et al., SIMULATION AND OBSERVATION OF THE STEP BUNCHING PROCESS GROWN ON GAAS(001) VICINAL SURFACE BY METALORGANIC VAPOR-PHASE EPITAXY, JPN J A P 1, 35(2B), 1996, pp. 1280-1284
Citations number
13
Categorie Soggetti
Physics, Applied
Volume
35
Issue
2B
Year of publication
1996
Pages
1280 - 1284
Database
ISI
SICI code
Abstract
The step bunching processes on GaAs (001) vicinal surfaces grown by me talorganic vapor phase epitaxy (MOVPE) are investigated by experiment and the simulation method. In the early stage oi the growth, the step bunching height and the terrace widths increase linearly and saturate with increasing layer thickness. The step bunching height and the terr ace widths are estimated by the Monte Carlo simulation. From the fitti ng of the simulated step bunching process to that process of the exper iment, the activation energy of the up-side and down-side step sites c ompared with that of the terrace sites are obtained. Furthermore, the terrace width saturation mechanism is clarified.