The test chip of optically interconnected Kohonen net which realizes t
he parallel pattern recognition was designed and fabricated. The optic
al waveguides, micromirrors and photodiodes were integrated on a Si wa
fer and complementary metal oxide semiconductor (CMOS) chips were bond
ed on the same Si wafer. The optical input data are distributed to the
CMOS circuits by the branched waveguide and the distances between the
input and the reference data are calculated. This test circuit operat
ed at a frequency of 6.7 MHz.