CHARACTERIZATION BY SOLID-STATE V-51 NMR AND X-RAY-DIFFRACTION OF VANADIUM-OXIDE SUPPORTED ON ZRO2

Citation
Jr. Sohn et al., CHARACTERIZATION BY SOLID-STATE V-51 NMR AND X-RAY-DIFFRACTION OF VANADIUM-OXIDE SUPPORTED ON ZRO2, Bulletin of the Korean Chemical Society, 17(3), 1996, pp. 274-279
Citations number
26
Categorie Soggetti
Chemistry
ISSN journal
02532964
Volume
17
Issue
3
Year of publication
1996
Pages
274 - 279
Database
ISI
SICI code
0253-2964(1996)17:3<274:CBSVNA>2.0.ZU;2-R
Abstract
Vanadium oxide-zirconia catalysts were prepared by dry impregnation of powdered Zr(OH)(4) with aqueous solution of NH4VO3. The characterizat ion of prepared catalysts was performed using V-51 solid State NMR, XR D, and DSC. The addition of vanadium oxide up to 9 mol% to zirconia sh ifted the phase transitions of ZrO2 from amorphous to tetragonal towar d higher temperatures due to the interaction between vanadium oxide an d zirconia. On the basis of results of XRD and DSC, it is concluded th at the content of V2O5 monolayer covering most of the available zircon ia was 9 mol%. The crystalline V2O5 was observed only with the samples containing V2O5 content exceeding the formation of complete monolayer (9 mol%) on the surface of ZrO2.