Cr. Lu et al., ELECTROOPTICAL PROPERTIES OF THE SI DELTA-DOPED GAAS ALGAAS TRIPLE-BARRIER RESONANT-TUNNELING STRUCTURE/, JPN J A P 1, 35(2A), 1996, pp. 551-556
The electrooptical properties of a Si delta-doped GaAs/Al0.3Ga0.7As tr
iple-barrier resonant tunneling (TRT) nanostructure have been studied
by photoreflectance spectroscopy from 20 K to room temperature. The TR
T structure forms two coupled quantum wells. The first and the second
electronic subbands in the wide well are partially filled, and the cor
responding optical transitions are suppressed. The strongest spectral
feature is due to the enhancement of the subband resonance between the
two coupled wells. The ionized delta-doping centers in the Al0.3Ga0.7
As side barriers can induce internal electric fields, and cause oscill
atory spectral features when the photon energy is larger than the gap
of Al0.3Ga0.7As. Analyzing the oscillatory part of the spectrum gives
an internal electric field of 32 kV/cm, and an estimation of the elect
ron subband energy in the ionized delta-doping center induced potentia
l wells.