IMPACT OF A SINGLE DEFECT ON THE CONDUCTANCE - LOCAL INTERFERENCE ANDUNIVERSAL CONDUCTANCE FLUCTUATIONS

Authors
RALLS KS RALPH DC BUHRMAN RA
Citation
Ks. Ralls et al., IMPACT OF A SINGLE DEFECT ON THE CONDUCTANCE - LOCAL INTERFERENCE ANDUNIVERSAL CONDUCTANCE FLUCTUATIONS, Physical review. B, Condensed matter, 47(16), 1993, pp. 10509-10514
Citations number
29
Categorie Soggetti
Physics, Condensed Matter
Journal title
Physical review. B, Condensed matter → ACNP
ISSN journal
01631829
Volume
47
Issue
16
Year of publication
1993
Pages
10509 - 10514
Database
ISI
SICI code
0163-1829(1993)47:16<10509:IOASDO>2.0.ZU;2-#
Abstract
By reversibly reconfiguring a single defect in a mesoscopic copper nan obridge < 10 nm wide, we have measured both the local interference and universal-conductance-fluctuation contributions to the impact of a si ngle defect on the conductance. Both effects are in good agreement wit h the predictions of theory, despite the fact that the defects that re configure are more complicated than simple point defects.