SPATIAL LIGHT-MODULATOR PHASE DEPTH DETERMINATION FROM OPTICAL DIFFRACTION INFORMATION

Authors
MCCLAIN JL ERBACH PS GREGORY DA YU FTS
Citation
Jl. Mcclain et al., SPATIAL LIGHT-MODULATOR PHASE DEPTH DETERMINATION FROM OPTICAL DIFFRACTION INFORMATION, Optical engineering, 35(4), 1996, pp. 951-954
Citations number
3
Categorie Soggetti
Optics
Journal title
Optical engineering → ACNP
ISSN journal
00913286
Volume
35
Issue
4
Year of publication
1996
Pages
951 - 954
Database
ISI
SICI code
0091-3286(1996)35:4<951:SLPDDF>2.0.ZU;2-Y
Abstract
A noninterferometric technique is presented for determining the phase modulating characteristics of spatial light modulators. Examining the far-field diffraction pattern intensity distribution for specific inpu t functions enables the phase modulation to be calculated. Results are compared with usual interferometric techniques for a liquid crystal b ased modulator. (C) 1996 Society of Photo-Optical Instrumentation Engi neers.