The teaching of power semiconductor devices often requires a more deta
iled presentation of the basic physical and electrical parameters than
used in semiconductor device physics courses; this is true not only f
or the standard power devices, like BGTs, GTOs and power MOSs, but als
o for the more recent ones that merge the MOS effect with bipolar oper
ation, like IGBTs, MCTs, ESTs, etc. In fact, usually in these basic co
urses many important items for the power devices such as the limiting
effects of breakdown, the temperature effects on transport properties,
the constraints posed by the large area and low doping, the effects o
f high injections and the limits imposed by high current effects, like
secondary breakdown, are not considered. In this paper some of the po
ints will be briefly recalled that could be considered in courses deal
ing with power semiconductor devices, with the aim of suggesting a pos
sible and useful link between the basic properties studied in solid st
ate physics courses and the performance of modern power devices. In pa
rticular, the dependence of mobility and lifetime on doping, injection
level and temperature should be stressed because they play a major ro
le in the electrical operation of the devices. Secondly, the basic eff
ects that limit the ratings of the power devices both in steady state
conditions and in the rum-on and rum-off transients must be discussed
and used to understand their role in the rating of different types of
devices, either unipolar, bipolar, or mixed MOS-bipolar ones. Finally,
the 2D effects that act in determining some important phenomena in po
wer devices should be presented both with simplified analysis and with
CAD tools; these latter need to be introduced to make the student awa
re of their use and possibilities.