NUMERICAL-SIMULATION OF THE INSULATED BASE MOS-CONTROLLED THYRISTOR

Citation
D. Flores et al., NUMERICAL-SIMULATION OF THE INSULATED BASE MOS-CONTROLLED THYRISTOR, Microelectronics, 27(2-3), 1996, pp. 177-180
Citations number
6
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
ISSN journal
00262692
Volume
27
Issue
2-3
Year of publication
1996
Pages
177 - 180
Database
ISI
SICI code
0026-2692(1996)27:2-3<177:NOTIBM>2.0.ZU;2-K
Abstract
This paper is aimed at the analysis of the insulated base MOS-controll ed thyristor (IBMCT) using numerical simulations. This power device is composed of a vertical thyristor structure, two MOS gates (on-gate an d off-gate) and a floating ohmic contact (FOG). Transient simulations confirm the turn-off capability, and show that holes are diverted from the p-base to the FOC during the turn-off process. The electrical cha racteristics have been compared with those of the shorted anode IBMCT. It is pointed out that this last structure is significantly faster th an the IBMCT because the shorted anode provides a direct path for the extraction of the electron charge excess existing in the drift region during the turn-off process.