R. Schlesinger et al., ISFETS WITH SPUTTERED SODIUM ALUMINOSILICATE GLASS MEMBRANES, Fresenius' journal of analytical chemistry, 354(7-8), 1996, pp. 852-856
Sodium ion sensitive field-effect transistors (ISFETs) based on reacti
vely sputtered sodium alumino-silicate (NAS) glass membranes are inves
tigated. Using an inverted cylindrical magnetron, NAS films with defin
ed and reproducible composition are obtained. Radiation damage in the
gate dielectric is largely eliminated by annealing at 450 degrees C. T
he Na+ sensitivity, the selectivity with respect to H+ and K+ ions, th
e response time, the conditioning period, the long-term drift, and the
lifetime are evaluated. The ISFETs exhibit a near-Nernstian Na+ respo
nse down to 10(-4) mol/l in solutions of pH greater than or equal to 7
. The NAS films are physically very robust and have excellent chemical
durability, e.g., a sensor with a 110 nm thick membrane lasts for abo
ut 8 months. The overall sensor properties compare well with those of
a commercial Na+ selective glass electrode.