Aj. Miller et al., DOMINANT ROLE OF E' CENTERS IN X-RAY-INDUCED, VISIBLE LUMINESCENCE INHIGH-PURITY AMORPHOUS SILICAS, Physical review. B, Condensed matter, 53(14), 1996, pp. 8818-8820
Detailed measurements of the x-ray-dose dependence of spectrally resol
ved x-ray-induced luminescence in bulk high-purity alpha-SiO2 were per
formed. The dose dependence of the luminescence intensity is compared
to that of the paramagnetic E'(gamma)-center concentration in two type
s of silicas. Clear experimental evidence is presented that the main f
eatures of the 2.6 and 2.75 eV luminescence bands are due to the same
radiation-induced defect, and that this defect is related to the E'(ga
mma) center.