We propose a simple model which accounts for the major features and sy
stematics of experiments on the c,=axis resistivity, p(c) for La-2-xSr
xCuO4, YBa(2)Cu(3)0(6+x), and Bi2S2CaCu2O8. We argue that the c-axis r
esistivity can be separated into contributions from in-plane dephasing
and the c-axis ''barrier'' scattering processes, with the low-tempera
ture semiconductorlike behavior of p(c) arising from the suppression o
f the in-plane density of stares measured by in-plane magnetic Knight
shift experiments. We report on predictions for p(c) in impurity-doped
YBa2CU3O6+x materials.