The compressive deformation behavior of Ti-48Al-2Nb-2Cr in the duplex
microstructural morphology has been studied at strain rates of 0.001 a
nd 2000 s(-1) over the temperature range from -196 to 1100 degrees C.
The yield stress for the duplex microstructure is strain rate sensitiv
e at 25 degrees C and increases with temperature from 500 to 1100 degr
ees C at a strain rate of 2000 s(-1). TEM investigations revealed that
deformation occurs in gamma-TiAl by means of {111}[112] twinning, 1/2
[110] slip and [101] superdislocations under all conditions depending
on the orientation of the grain with respect to the deformation axis.
Optical metallography revealed that twinning increases with increasing
strain rate. The flow stress anomaly is discussed in reference to the
dislocation substructure in gamma-TiAl.