T. Geipel et al., ON BASAL SLIP AND BASAL TWINNING IN SAPPHIRE (ALPHA-AL2O3) .3. HRTEM OF THE TWIN MATRIX INTERFACE/, Acta materialia, 44(5), 1996, pp. 2165-2174
Citations number
16
Categorie Soggetti
Material Science","Metallurgy & Metallurigical Engineering
A high resolution transmission electron microscopy (HRTEM) investigati
on of basal twins in sapphire (alpha-Al2O3) indicates that they are ei
ther Type-II or Type-I ''glide'' twins with a shear of 1/3 [10 (1) ove
r bar 0] (the latter type twin is also equivalent to a Type-II screw t
win with reverse shear, 1/3[(1) over bar 010]). These two types cannot
be distinguished with the resolution of the HRTEM used in the present
study. However, a Type-II twin is consistent with the model of basal
twinning presented in the second paper of this series, with an AC'BA'C
B'/a'bc'ab'c stacking sequence for the Al-O-Al layers along a directio
n perpendicular to the twin/matrix interface, and pair potential calcu
lations suggest that Type-II interfaces have the lowest energy of all
possible twin interfaces in sapphire. An overlap of the twin/matrix le
ads to Moire-like contrast features. This can also be explained with t
he proposed twinning mechanism.