JOSEPHSON EFFECTS IN BI-2212 SINGLE-CRYSTALS

We have developed a processing technique for Bi2Sr2CaCu2O8+x Single cr ystals to study current-voltage (I-V) characteristics along the c-axis . A planar device with a mesa is fabricated by making use of photolith ography, leading to advantages in preparation compared with a standard two-probe technique. Multiple branches in the I-V curves and magnetic field dependence of the critical current support the intrinsic Joseph son junction model, consistently with the previous result obtained by the two-probe technique.