Authors
Citation
D. Haneman, ANALYSIS OF THE SI(111)5 X 5-2 X-1 PHASE-BOUNDARY, Journal of physics. Condensed matter, 5(18), 1993, pp. 2869-2874
Citations number
18
Categorie Soggetti
Physics, Condensed Matter
Journal title
ISSN journal
09538984
Volume
5
Issue
18
Year of publication
1993
Pages
2869 - 2874
Database
ISI
SICI code
0953-8984(1993)5:18<2869:AOTSX5>2.0.ZU;2-Y
Abstract
Experimental scanning tunnelling microscopy data for the Si(111)5 x 5
- 2 x 1 phase boundary are analysed with reference to the structure of
the 2 x 1 surface. The height change data are subject to significant
correction factors, making interpretation difficult due to the small t
heoretical differences involved. The theoretical lateral differences a
re much larger, being 3.3 angstrom, and these are analysed.