We describe the results of optical and electrical characterization of
seeded physical vapor transport (SPVT) ZnSe suitable for use as substr
ates in homoepitaxy. Photoluminescence, Hall measurements, C-V data an
d thermally simulated conductivity and luminescence (TSC/TL) results a
re described. As-grown SPVT wafers are of very high crystallinity and
of high resistivity. N-type conductivity can be induced by post-growth
Zn-extraction, producing wafers with room temperature resistivities a
s low as 3.82 OMEGA cm and free carrier densities of approximately 1.5
x 10(15) cm-3. The conductivity is limited by the presence of unwante
d acceptors due to Cu and Li impurities. Deep level analysis reveals v
arious electron and hole states within the as-grown specimens. Trap de
pths and capture cross-sections are evaluated for the major centers.