Hp. Lang et al., STUDY OF C-60 THIN-FILMS BY SCANNING-TUNNELING-MICROSCOPY - PRESSURE-INDUCED TRANSFORMATION TO AN AMORPHOUS-CARBON PHASE, Synthetic metals, 77(1-3), 1996, pp. 161-164
A scanning tunnelling microscope is used to exert pressure in the GPa
range to a fullerene C-60 thin film on Au(111) by operating the micros
cope at a tunnelling current of 40 nA and a bias voltage of 4 mV. The
fullerene molecules are locally transformed into a disordered carbon p
hase. Pair and angular distribution functions based on scanning tunnel
ling microscopy (STM) images on the atomic scale confirm the presence
of an amorphous structure with a nearest-neighbour distance of 0.28 nm
and a second-nearest-neighbour distance of 0.37 nm. The protrusions r
esolved in the STM images are interpreted as carbon rings.