STUDY OF C-60 THIN-FILMS BY SCANNING-TUNNELING-MICROSCOPY - PRESSURE-INDUCED TRANSFORMATION TO AN AMORPHOUS-CARBON PHASE

Citation
Hp. Lang et al., STUDY OF C-60 THIN-FILMS BY SCANNING-TUNNELING-MICROSCOPY - PRESSURE-INDUCED TRANSFORMATION TO AN AMORPHOUS-CARBON PHASE, Synthetic metals, 77(1-3), 1996, pp. 161-164
Citations number
11
Categorie Soggetti
Physics, Condensed Matter","Material Science","Polymer Sciences
Journal title
ISSN journal
03796779
Volume
77
Issue
1-3
Year of publication
1996
Pages
161 - 164
Database
ISI
SICI code
0379-6779(1996)77:1-3<161:SOCTBS>2.0.ZU;2-D
Abstract
A scanning tunnelling microscope is used to exert pressure in the GPa range to a fullerene C-60 thin film on Au(111) by operating the micros cope at a tunnelling current of 40 nA and a bias voltage of 4 mV. The fullerene molecules are locally transformed into a disordered carbon p hase. Pair and angular distribution functions based on scanning tunnel ling microscopy (STM) images on the atomic scale confirm the presence of an amorphous structure with a nearest-neighbour distance of 0.28 nm and a second-nearest-neighbour distance of 0.37 nm. The protrusions r esolved in the STM images are interpreted as carbon rings.