We have performed high-dose carbon-ion implantations into copper subst
rates at high temperature with the objective of producing single cryst
alline diamond thin films. An important density of giant carbon onions
has been identified in a turbostratic graphite layer formed on the co
pper surface. We have characterized these giant fullerenes (up to 1 mu
m in diameter) by transmission electron microscopy (TEM), high-resolu
tion TEM (HRTEM) and electron energy loss spectroscopy (EELS), and we
propose two possible mechanisms of formation of the carbon onions duri
ng the implantation process.