STRUCTURAL-ANALYSIS OF FERROMAGNETIC LATENT TRACKS IN RCO(2) THIN-FILMS (R=Y,TM,CE) BY MEANS OF X-RAY-DIFFRACTION

Authors
GHIDINI M NOZIERES JP GIVORD D LIENARD A GERVAIS B DOORYHEE E
Citation
M. Ghidini et al., STRUCTURAL-ANALYSIS OF FERROMAGNETIC LATENT TRACKS IN RCO(2) THIN-FILMS (R=Y,TM,CE) BY MEANS OF X-RAY-DIFFRACTION, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 107(1-4), 1996, pp. 344-348
Citations number
12
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
Journal title
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms → ACNP
ISSN journal
0168583X
Volume
107
Issue
1-4
Year of publication
1996
Pages
344 - 348
Database
ISI
SICI code
0168-583X(1996)107:1-4<344:SOFLTI>2.0.ZU;2-I
Abstract
YCo2 paramagnetic crystalline thin films have been irradiated by beams of GeV U and Pb ions, resulting in the formation of ferromagnetic amo rphous latent tracks. The combination of quantitative X-ray diffractio n analysis in regular theta - 2 theta mode and in grazing incidence ge ometry reveals latent tracks of around 20 Angstrom in diameter embedde d in a stressed crystalline matrix (Delta a/a approximate to 1%). Diff erent behaviours are observed in the parent systems TmCo2 and CeCo2: T mCo2 is irradiation insensitive while CeCo2 exhibits strong recrystall ization effects.