T. Steckenreiter et al., SOLVENT-INDUCED TRACK SENSITIZATION - ROLE OF AMINES, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 107(1-4), 1996, pp. 393-396
A necessary condition for etching of particle tracks in polymers is th
e selective removal of molecular fragments formed along the ion path.
Until recently it was assumed that solvent induced track sensitization
by N,N-dimethylformamide (DMF) in poly(ethyleneterephthalate) (PET) r
emoves oligomers from the track core exclusively via a dissolution pro
cess. The present study shows that degradation products of DMF, in par
ticular amines, are also involved in the sensitization process. For th
is purpose, the chemical interaction of amines with heavy ion irradiat
ed PET was examined by various techniques. It was shown that amines in
duce a selective track ''pre-etching''. Compared with pure DMF, the tr
ack etching rate increases with amine concentration.