SURFACE-TEMPERATURE CORRECTION FOR ACTIVE INFRARED REFLECTANCE MEASUREMENTS OF NATURAL MATERIALS

Authors
Citation
Wc. Snyder et Zm. Wan, SURFACE-TEMPERATURE CORRECTION FOR ACTIVE INFRARED REFLECTANCE MEASUREMENTS OF NATURAL MATERIALS, Applied optics, 35(13), 1996, pp. 2216-2220
Citations number
7
Categorie Soggetti
Optics
Journal title
ISSN journal
00036935
Volume
35
Issue
13
Year of publication
1996
Pages
2216 - 2220
Database
ISI
SICI code
0003-6935(1996)35:13<2216:SCFAIR>2.0.ZU;2-5
Abstract
Land surface temperature algorithms for the moderate resolution imagin g spectroradiometer satellite instrument will require the spectral bid irectional reflectance distribution function (BRDF) of natural surface s in the thermal infrared. We designed the spectral infrared bidirecti onal reflectance and emissivity instrument to provide such measurement s by the use of a Fourier transform infrared spectrometer. A problem w e encountered is the unavoidable surface heating caused by the source irradiance. For our system, the effects of the heating can cause a 30% error in the measured BRDF. The error caused by heating is corrected by temporally curve fitting the radiance signal. This curve-fitting te chnique isolates the radiance caused by reflected irradiance. With thi s correction, other factors dominate the BRDF error. It is now similar to 5% and can be improved further. The method is illustrated with mea surements of soil BRDF. (C) 1996 Optical Society of America