The deviations between the expected behavior of ideal antiferromagneti
cally coupled multilayer systems and the experimentally observed featu
res are explained by defects exhibiting ferromagnetic coupling along n
arrow lines. Using a relaxation method, the two-dimensional magnetizat
ion distribution around the defect has been calculated and the field d
ependence of the mean magnetization as well as the resistivity have be
en derived, The calculated curves show the typical features of irrever
sibility known from experimental results.