AN ALTERNATIVE APPROACH FOR MAGNETOOPTIC CALCULATIONS INVOLVING LAYERED MEDIA

A generalized 4 X 4 matrix method for solving for the propagation of e lectromagnetic plane waves in optically isotropic and anisotropic stra tified media has been extended to calculate the relative Kerr or Farad ay intensities for most optical arrangements. The utility of this meth od lies in its versatility. The layered structures may consist of magn etic metals, non-magnetic metals, insulators, or semiconductors. For a given light scattering arrangement, the reflectivity, Kerr rotation, Kerr ellipticity, Faraday rotation, and Faraday ellipticity may be cal culated as functions of the incidence angle, laser frequency, overlaye r coverage, or underlayer thickness. Experimental intensity measuremen ts can be checked for different configurations of the light-polarizing and beam-modulating optics.