A LIFETIME CORRECTION METHOD FOR THE GAMMA-RAY YIELD MEASUREMENT IN (N,X-GAMMA) EXPERIMENTS

Authors
ZHOU HY HUANG GS FAN GY
Citation
Hy. Zhou et al., A LIFETIME CORRECTION METHOD FOR THE GAMMA-RAY YIELD MEASUREMENT IN (N,X-GAMMA) EXPERIMENTS, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 371(3), 1996, pp. 504-509
Citations number
5
Categorie Soggetti
Nuclear Sciences & Tecnology","Physics, Particles & Fields","Instument & Instrumentation",Spectroscopy
Journal title
Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment → ACNP
ISSN journal
01689002
Volume
371
Issue
3
Year of publication
1996
Pages
504 - 509
Database
ISI
SICI code
0168-9002(1996)371:3<504:ALCMFT>2.0.ZU;2-N
Abstract
A lifetime correction method for the gamma-ray yield measurement in (n ,xy) experiments performed by means of TOF technique is proposed. This method makes it possible to determine prompt and delayed gamma-ray da ta simultaneously in an experiment. It can separate the delayed compon ent from a mixed gamma-ray peak exactly, so that completely pure promp t gamma-ray data can be obtained. It provides an in-beam measurement m ethod for neutron activation cross sections. Especially, it has obviou s advantages for yield measurements of decay gamma-rays with lifetimes ranging from 1 ns to several hours. Application techniques under vari ous conditions are discussed. As examples, some results for F, Al and Si samples under 14.9 MeV neutron bombardment are given.