IBM EXPERIMENTS IN SOFT FAILS IN COMPUTER ELECTRONICS (1978-1994)

Authors
ZIEGLER JF CURTIS HW MUHLFELD HP MONTROSE CJ CHIN B NICEWICZ M RUSSELL CA WANG WY FREEMAN LB HOSIER P LAFAVE LE WALSH JL ORRO JM UNGER GJ ROSS JM OGORMAN TJ MESSINA B SULLIVAN TD SYKES AJ YOURKE H ENGER TA TOLAT V SCOTT TS TABER AH SUSSMAN RJ KLEIN WA WAHAUS CW
Citation
Jf. Ziegler et al., IBM EXPERIMENTS IN SOFT FAILS IN COMPUTER ELECTRONICS (1978-1994), IBM journal of research and development, 40(1), 1996, pp. 3-18
Citations number
34
Categorie Soggetti
Computer Science Hardware & Architecture
Journal title
IBM journal of research and development → ACNP
ISSN journal
00188646
Volume
40
Issue
1
Year of publication
1996
Pages
3 - 18
Database
ISI
SICI code
0018-8646(1996)40:1<3:IEISFI>2.0.ZU;2-N
Abstract
This historical review covers IBM experiments in evaluating radiation- induced soft fails in LSI electronics over a fifteen-year period, conc entrating on major scientific and technical advances which have not be en previously published.