CHAIN-END CONTRIBUTION IN STATIC SECONDARY-ION MASS-SPECTROMETRY OF OLIGOMERIC POLY(ETHYLENE GLYCOLS)

Citation
Ag. Shard et al., CHAIN-END CONTRIBUTION IN STATIC SECONDARY-ION MASS-SPECTROMETRY OF OLIGOMERIC POLY(ETHYLENE GLYCOLS), Surface and interface analysis, 24(12), 1996, pp. 787-793
Citations number
27
Categorie Soggetti
Chemistry Physical
ISSN journal
01422421
Volume
24
Issue
12
Year of publication
1996
Pages
787 - 793
Database
ISI
SICI code
0142-2421(1996)24:12<787:CCISSM>2.0.ZU;2-I
Abstract
Poly(ethylene glycols) (PEGs) of a variety of molecular weights rangin g from a few hundred Da to 900 kDa, terminated with a range of functio nal groups, were cast as thin films and examined by static secondary i on mass spectrometry (SSIMS). The intensities of ions in the SSIMS spe ctra are examined and it is demonstrated that the m/z 45 ion relative intensity (compared to the m/z 43 intensity) for hydroxy-terminated PE Gs increases from 68% at very high molecular weight to 84% at 2 kDa an d below. Those PEGs terminated with deuteroxy groups demonstrate a str ong ion at m/z 46 at low molecular weight, which indicates that the m/ z 45 intensity in hydroxy-PEG is strongly influenced by the presence o f terminal groups in the PEG film. It is shown that amino- and methoxy -terminated PEGs have a similar mit 45 relative intensity to high-mole cular-weight PEG, suggesting that hydrogen abstraction in these system s does not occur to any great extent and the excess intensity at m/z 4 5 for hydroxy-PEG derives from fragment ions formed by the direct clea vage of polymer end groups.