S. Poulston et al., SURFACE OXIDATION AND REDUCTION OF CUO AND CU2O STUDIED USING XPS ANDXAES, Surface and interface analysis, 24(12), 1996, pp. 811-820
Using XPS and x-ray-excited Auger electron spectroscopy (XAES), we hav
e studied the variation in surface composition of CuO and Cu2O with a
variety of high-vacuum treatments, including vacuum annealing, oxidati
on and hydrogen reduction. Prolonged annealing of CuO results in the f
ormation of a thick layer of Cu2O at the surface whilst vacuum anneali
ng of Cu2O produces a thin (possibly one monolayer) film of Cu metal.
Both bulk Cu2O and the thick Cu2O film generated from vacuum-annealed
CuO were oxidized to CuO by heating at 800 K in 1 x 10(-4) mbar O-2, t
he original surface being regenerated with vacuum annealing at the sam
e temperature. Both CuO and Cu2O are reduced to metal at the surface b
y heating in 1 x 10(-4) mbar hydrogen at 400 K. In the case of CuO, th
e extent of reduction varies with the thermal history of the sample, w
ith prolonged vacuum annealing producing a more reducible surface. Hyd
rogen-reduced CuO and Cu2O were both reoxidized on vacuum annealing, d
emonstrating the diffusion of lattice oxygen to the surface.