MAGNETIC-X-RAY LINEAR DICHROISM IN THE PHOTOELECTRON-SPECTROSCOPY OF ULTRATHIN MAGNETIC ALLOY-FILMS

Citation
Jg. Tobin et al., MAGNETIC-X-RAY LINEAR DICHROISM IN THE PHOTOELECTRON-SPECTROSCOPY OF ULTRATHIN MAGNETIC ALLOY-FILMS, Journal of applied physics, 79(8), 1996, pp. 5626-5628
Citations number
28
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
79
Issue
8
Year of publication
1996
Part
2B
Pages
5626 - 5628
Database
ISI
SICI code
0021-8979(1996)79:8<5626:MLDITP>2.0.ZU;2-2
Abstract
The magnetic structure of nanoscale alloy films has been probed using the magnetic x-ray linear dichroism in photoelectron spectroscopy. FeN i and CoFe epitaxial films were grown on Cu(001), in situ and using mo lecular beam epitaxy techniques. The magnetic x-ray linear dichroism m easurements were made at the Spectromicroscopy Facility of the Third G eneration Advanced Light Source. Because soft x-rays were used to gene rate photoemission from the 3p core levels, both elemental selectivity and magnetic sensitivity were achieved simultaneously. (C) 1996 Ameri can Institute of Physics.