DOMAIN-STRUCTURES AT THE CROSS-SECTIONS OF THIN-FILM INDUCTIVE RECORDING-HEADS

Using a scanning Kerr effect microscope with external ac-tickle field excitation, zigzagged and slanted intersections of domain walls were o bserved at the symmetry-axis cross sections of thin film inductive hea ds. These domain walls are believed to be the intersections of edge-cl osure domain walls, with the magnetization on the two sides of the wal ls (or lines) oriented in ''head-to-head'' or ''tail-to-tail'' configu rations. They are thus slanted or zigzagged in order to spread the cha rges along the walls over a larger region, thereby reducing magnetosta tic energy. This interpretation is further evident by the observation that upon applying a small de bias field in the symmetry-axis directio n, the slanted or zigzagged intersections of domain walls were observe d to displace according to the field direction, and sometimes deformed to different configurations. Upon lapping the heads from their air-be aring surfaces, slanted domain walls at the sloped backgap cross secti ons were occasionally observed. (C) 1996 American Institute of Physics .