RESISTIVITIES OF SPUTTERED AG(3.3NM) CU(T(CU)), AG(3.3NM)/AU(T(AU)), AND NI(4.2NM)/CO(T(CO)) MULTILAYERS AT 4-5 AND 295 K/

To help clarify the sources of the 67% periodic oscillations in the in -plane saturation resistivity, rho(s) (rho(s) varied from 2.5 to 5 mu Omega cm at 4.2 K) of molecular beam epitaxy-grown epitaxial Ni/Co mul tilayers of total thickness, t(T) approximate to 100 nm recently repor ted by Gallego et al. [Phys. Rev. Lett. 74, 4515 (1995)] we have measu red the in-plane resistivities at 4-5 and 295 K of Ag/Cu, Ag/Au, and N i/Co multilayers with t(T) approximate to 100 nm, de sputtered nonepit axially onto (001) Si. In no case do we see reproducible periodic osci llations, and any variations are always similar at 4-5 and 295 K. Our results show that oscillations of the size seen by Gallego are not sim ply a consequence of an average multilayer resistivity as low as 3.5 m u Omega cm. (C) 1996 American Institute of Physics.